BGA529 test Socket SD Solution programmer adapter validation debug
Product Description
The SD solution is designed for test, debug, validation, and programming of eMMC, eMCP devices
The SD solution provides a compact test solution for eMMC, eMCP devices used in applications such as handheld, mobile, and TV product development.
- Test, debug, validation, and programming of eMMC, eMCP devices
- Failure analysis / System and wafer test
- Package and Chip qualification
- Production prototype / Data recover
- Suitable for devices of Samsung, Hynix, Toshiba, Intel, Kingston etc eMMC and eMCP.
- Support eMMC version: ≤eMMC5.0.
- Support hot plug, eMMC can be directly connected to PC with SD card reader.
- Realize reading, accessing and writting data for eMMC and eMCP devices
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Mechanical
Socket Body: PPS
Socket Lid: AL
Contact: Spring Probe
Operation Temperature: -40ºC to 140ºC
Life Span at Operating Travel:100K min.
Cycles Spring Force:27g per Pin
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Electrical
Current Rating (Continuous) : 2.59A
Self Inductance:1.57nH
Bandwidth -1dB:10GHz
DC Resistance: 42mohm
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• Place a Device by hand on to the socket.
• Lock the lid.
• Connect to PC by SD Card Reader.
• Now it is ready for use.
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