Model: | EL defect |
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Brand: | Keyland Gosun |
Origin: | Made In China |
Category: | Electronics & Electricity / Electronic Instrument / Analysis Instrument |
Label: | EL defect detector , testing cracked |
Price: |
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Min. Order: | 1 set |
Live Chat: | Last Online:30 Sep, 2016 |
EL Defect Detector
Applications:
Used in testing cracked, broken, Weld broken deleted aolar module and the abnormal phenomenon of the different conversion efficiency of single cells
Technology Characters :
1.The equipment has applied for national patent;Imported original infrared camera to ensure image acquisition clear and accurate;
2.Close type optical route design,to guarantee the steady running of the equipment, better adapt to different environments;
3.Total English screen interface, can automatically or manually scan graphical coding, and proceed to save files
4.Enlarged scanning pictures can show the detail and make it easy to decide
The main technical parameters:
Product Name | EL Defect Detector | |||||
Effective Testing area | 1200*2100mm | |||||
Resolution | 11.4 Megapixels or 6.1 Megapixels | |||||
Sensitivity | Can detect crack width less than 0.2um | |||||
Test Time | 1s-60s Can be set freely | |||||
Testing methods | Uncontact free style | |||||
Power Parameters | Single-phrase 220V 10A ,Max load currency 10A | |||||
Configuration | Testing platform(include infrared camera),computer,professional software |