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UV Vis Spectrophotometer 1
  • UV Vis Spectrophotometer 1

UV Vis Spectrophotometer

Model:UV18 Series
Brand:A & E Lab
Origin:Made In China
Category:Electronics & Electricity / Other Electrical & Electronic
Label:spectrophotometer , Falme Photometer , Whiteness Meter
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A & E Lab Instruments Co.,Ltd.

Free MemberGuang Dong - China
Live Chat:Last Online:08 Jun, 2012

Product Description

Application:
This instrument is a standard instrument which based on the principle of spectrophotometer. This instrument can be measured the transmittance,  absorbency & concentration direct reading of samples within 340~1000nm wavelength ranges. Meanwhile, it can be easily connected printer or PC process. This instrument can be widely applied to clinical sanitation, biochemistry, environment protection, food inspection, petrochemical, tertiary institutions, basic teaching experiments,etc.
Technical Specifications:
Model: AE-UV1801
Wavelength Range: 190 - 1100nm
Spectral Bandwidth: 2nm or 1nm
Optical System: Double Beam & Czerny-Turner; Grating 1200 line/mm
Wavelength Accuracy: ±0.1 nm(656.1 nm D2), ±0.3 nm(Whole wavelength range);
Wavelength Repeatability: ±0.2nm
Wavelength Resolution: 0.1nm
Photometric Range: ­0.3 to 3A ; 0-200%T; -9999 to 9999C;
Photometric Accuracy: ±0.002A@0.5A , ±0.3%(0~100%T)
Photometric Repeatability: ±0.001A@0.5A , ±0.15%T(0~100%T)
Stray Light: ≤ 0.05%T (220 nm, NaI; 340 nm, NaNO2)
Baseline Flattness: ±0.001A
Stability: ±0.0005A/hr @500nm, 0A
Photometric noise: ±0.0003A
Data Output: 320×240 Dots Array Graphic LCD; USB2.0 printer driver(Optional); USB1.1 Connecting to computer;

Model: AE-UV1801S
Wavelength Range: 190 - 1100nm
Spectral Bandwidth: 0.5nm,1nm,2nm,4nm,5nm Variable
Optical System: Double Beam & Czerny-Turner; Grating 1200 line/mm
Wavelength Accuracy: ±0.1 nm(656.1 nm D2), ±0.3 nm(Whole wavelength range);
Wavelength Repeatability: ±0.2nm
Wavelength Resolution: 0.1nm
Photometric Range: ­0.3 to 3A ; 0-200%T; -9999 to 9999C;
Photometric Accuracy: ±0.002A@0.5A , ±0.3%(0~100%T)
Photometric Repeatability: ±0.001A@0.5A , ±0.15%T(0~100%T)
Stray Light: ≤ 0.05%T (220 nm, NaI; 340 nm, NaNO2)
Baseline Flattness: ±0.001A
Stability: ±0.0005A/hr @500nm, 0A
Photometric noise: ±0.0003A
Data Output: 320×240 Dots Array Graphic LCD; USB2.0 printer driver(Optional); USB1.1 Connecting to computer;

Model: AE-UV1802
Wavelength Range: 190 - 1100nm
Spectral Bandwidth: 2nm or 1nm (Optional)
Optical System: Littrow; Grating 1200 line/mm
Wavelength Accuracy: ±0.1 nm(656.1 nm D2), ±0.3 nm(Whole wavelength range);
Wavelength Repeatability: ±0.2nm
Wavelength Resolution: 0.1nm
Photometric Range: ­0.3 to 3A ; 0-200%T; -9999 to 9999C;
Photometric Accuracy: ±0.002A@0.5A , ±0.3%(0~100%T)Photometric Repeatability: ±0.001A@0.5A , ±0.15%T(0~100%T)
Stray Light: ≤ 0.05%T (220 nm, NaI; 340 nm, NaNO2)
Baseline Flattness: ±0.001A
Stability: ±0.0005A/hr @500nm, 0A
Photometric noise: ±0.001A (500nm, 0A, 2nm SBW)
Data Output: 320×240 Dots Array Graphic LCD; Optional built-in thermal printer/USB2.0 printer driver; USB1.1 Connecting to computer;

Model: AE-UV1802S
Wavelength Range: 190 - 1100nm
Spectral Bandwidth: 0.5nm,1nm,2nm,4nm,5nm Variable
Optical System: Czerny-Turner,Single Beam or Split Beam; Grating 1200 line/mm
Wavelength Accuracy: ±0.1 nm(656.1 nm D2), ±0.3 nm(Whole wavelength range);
Wavelength Repeatability: ±0.2nm
Wavelength Resolution: 0.1nm
Photometric Range: ­0.3 to 3A ; 0-200%T; -9999 to 9999C;
Photometric Accuracy: ±0.002A@0.5A , ±0.3%(0~100%T)Photometric Repeatability: ±0.001A@0.5A , ±0.15%T(0~100%T)
Stray Light: ≤ 0.05%T (220 nm, NaI; 340 nm, NaNO2)
Baseline Flattness: ±0.001A
Stability: ±0.0005A/hr @500nm, 0A
Photometric noise: ±0.001A (500nm, 0A, 2nm SBW)
Data Output: 320×240 Dots Array Graphic LCD; Optional built-in thermal printer/USB2.0 printer driver; USB1.1 Connecting to computer;

Model: AE-UV1803
Wavelength Range: 190 - 1100nm
Spectral Bandwidth: 2nm/4nm (optional)
Optical System: Split beam or Littrow,Grating 1200 line/mm
Wavelength Accuracy: ±0.5nm
Wavelength Repeatability: ±0.2nm
Wavelength Resolution: 0.1nm
Photometric Range: ­0.3 to 3A ; 0-200%T; -9999 to 9999C;
Photometric Accuracy: ±0.004A@0.5A , ±0.5%T(0~100%T)
Photometric Repeatability: ±0.002A@0.5A , ±0.3%T(0~100%T)
Stray Light: ≤0.05%T@220nm & 340nm
Baseline Flattness: ±0.002A(PC running software required)
Stability: ±0.002A/hr @500nm, 0A
Data Output: 128×64Dots Array Graphic LCD; Optional built-in thermal printer; USB1.1 Connecting to computer;

Model: AE-VIS1810
Wavelength Range: 325 - 1100nm
Spectral Bandwidth: 2nm/4nm (optional)
Optical System: Split beam or Littrow,Grating 1200 line/mm
Wavelength Accuracy: ±0.8nm
Wavelength Repeatability: ±0.3nm
Wavelength Resolution: 0.1nm
Photometric Range: ­0.3 to 3A ; 0-200%T; -9999 to 9999C;
Photometric Accuracy: ±0.004A@0.5A , ±0.5%T(0~100%T)
Photometric Repeatability: ±0.002A@0.5A , ±0.3%T(0~100%T)
Stray Light: ≤0.05%T@340nm
Baseline Flattness: ±0.002A(PC running software required)
Stability: ±0.002A/hr @500nm, 0A
Data Output: 128×64Dots Array Graphic LCD; Optional built-in thermal printer; USB1.1 Connecting to computer;

Model: AE-UV1804
Wavelength Range: 200-1000nm
Spectral Bandwidth: 2nm/4nm (optional)
Optical System: Split beam or Littrow,Grating 1200 line/mm
Wavelength Accuracy: ±2nm
Wavelength Repeatability: ±1nm
Wavelength Resolution: 1nm
Photometric Range: ­0.3 to 3A ; 0-200%T; -9999 to 9999C;
Photometric Accuracy: ±0.004A@0.5A , ±0.5%T(0~100%T)
Photometric Repeatability: ±0.002A@0.5A , ±0.3%T(0~100%T)
Stray Light: ≤0.05%T@ 220nm & 340nm
Stability: ±0.002A/hour @500nm ,0A
Sample Compartment: Accommodates 100mm Max pathlength cuvette
Data Output: 4 line×20 characters LCD; Optional built-in thermal printer; USB1.1 Connecting to computer;

Model: AE-VIS1820
Wavelength Range: 325 - 1000nm
Spectral Bandwidth: 2nm/4nm (optional)
Optical System: Split beam or Littrow,Grating 1200 line/mm
Wavelength Accuracy: ±2nm
Wavelength Repeatability: ±1nm
Wavelength Resolution: 1nm
Photometric Range: ­0.3 to 3A ; 0-200%T; -9999 to 9999C;
Photometric Accuracy: ±0.004A@0.5A , ±0.5%T(0~100%T)
Photometric Repeatability: ±0.002A@0.5A , ±0.3%T(0~100%T)
Stray Light: ≤ 0.1%T @ 340nm
Stability: ±0.002A/hour @500nm ,0A
Sample Compartment: Accommodates 100mm Max pathlength cuvette
Data Output: 4 line×20 characters LCD; Optional built-in thermal printer; USB1.1 Connecting to computer;

Model: AE-VIS1830
Wavelength Range: 325 - 1000nm
Spectral Bandwidth: 2nm/4nm (optional)
Optical System: Split beam or Littrow,Grating 1200 line/mm
Wavelength Accuracy: ±2nm
Wavelength Repeatability: ±1nm
Wavelength Resolution: 1nm
Photometric Range: ­0.3 to 3A ; 0-200%T; -9999 to 9999C;
Photometric Accuracy: ±0.004A@0.5A , ±0.5%T(0~100%T)
Photometric Repeatability: ±0.002A@0.5A , ±0.3%T(0~100%T)
Stray Light: ≤ 0.1%T @ 340nm
Stability: 50mm
Sample Compartment: Accommodates 100mm Max pathlength cuvette
Data Output: 4 line×20 characters LCD; Optional built-in thermal printer; USB1.1 Connecting to computer;


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UV Vis Spectrophotometer 1
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A & E Lab Instruments Co.,Ltd.

#1813,18F, No.55 Xi Di Er Rd, New Asia, Guangzhou, Guangdong, P.R.China.

Phone:
86-20-28093670
Fax:
86-20-28039794
Contact:
Ella (Sales)
Mobile:
28039790

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