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Interface Probe Test Pin IFP-007 for Transmitting Electrical Signals 1Interface Probe Test Pin IFP-007 for Transmitting Electrical Signals 2Interface Probe Test Pin IFP-007 for Transmitting Electrical Signals 3Interface Probe Test Pin IFP-007 for Transmitting Electrical Signals 4Interface Probe Test Pin IFP-007 for Transmitting Electrical Signals 5
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  • Interface Probe Test Pin IFP-007 for Transmitting Electrical Signals 2
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Interface Probe Test Pin IFP-007 for Transmitting Electrical Signals

Model:IFP-007
Brand:Centalic
Origin:-
Category:Electronics & Electricity / Electronic Components / Other Electronic Components
Label:high performance , low cost , best yield
Price: -
Min. Order:100 pc
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Member Information

Detail

Centalic Technology Development Ltd.

Free MemberHong Kong S.A.R
Live Chat:Last Online:09 Dec, 2022

Product Description

Interface Probe Test Pin IFP-007 for Transmitting Electrical Signals


Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-007, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-007 interface probe is 40.05 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome. 

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

 

Our inspection equipment include outer diameter checking machines, profile projectors, one-key inspection instruments, 3 dimension microscopes, AOI machines, spring force testers, vickers hardness testers, Metallurgical microscopes, X-ray plating thickness testers, salt spray testers, life testers, FDR testers, high and low temperature chambers, X-ray perspective inspection machines, network analyzers, HFSS, ADS, LCR meters, DC powers, DC electronic loads, withstand voltage testers, resistance meters, etc.

 
Welcome to browse our website and download any catalogs of our products.
 
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal


 


Product Image

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Send Inquiry to this Member

Centalic Technology Development Ltd.

Room B, 4/F, Good Luck Industrial Building,105 How Ming Street, Kwun Tong, Kowloon, Hong Kong

Phone:
00852-52857123
Fax:
00852-27978449
Contact:
Stella (salesperson)
Mobile:
52857123

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