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Test Probe B IEC61032 IEC60529 IP2X with bendable joint  1
  • Test Probe B IEC61032 IEC60529 IP2X with bendable joint  1

Test Probe B IEC61032 IEC60529 IP2X with bendable joint

Model:IEC61032
Brand:BND
Origin:Made In China
Category:Electronics & Electricity / Other Electrical & Electronic
Label:IEC61032 , TEST PROBE B , IEC60335
Price: US $250 / pc
Min. Order:1 pc
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Member Information

Detail

shenzhen Bonad Precision Instrument Co,.ltd

Free MemberGuang Dong - China
Live Chat:Last Online:20 Jun, 2016

Product Description

Bending test (Test probe B) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances

This is the “International” test finger required by most IEC61032 test probe B, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements with integral palm simulator. The handle and stop face are made of nylon.  Finger is made of stainless steel. All parts precision machined.

  • HT-I02A: Conform to the IEC60335-1 clause 20.2. Means of a test probe that is similar to test probe B of IEC 61032 but having a circular stop face with a diameter of 50 mm, instead of the non-circular face.

 

  • HT-I02B: Conform to the IEC60335-2-14 clause 20.2. Means of a test probe that is similar to test probe B of IEC 61032 but having a circular stop face with a diameter of 125 mm instead of the non-circular face, the distance between the tip of the test finger and the stop face being 100 mm.

 

Using methods:

1,The joint portion of Standard test finger can not touch the live parts or hazardous parts ,and it can’t enter 20mm-50mm baffles

2,Prevent access to dangerous parts of the test requirements, Test B need to bring 30 ± 3N thrust. Usually use with force gauge

3,In the electric shock test, we need to wire and configure the power supply(mains), the lamp unit.

 

Note

Test probe is precision stainless steel products, please use of gently and pay attention to maintenance

 

Reference Standard

IEC61032 IEC60950 IEC60335

IEC60529 IEC60045 IEC60884

IEC60745

 

Specification

Knurled Finger Diameter:12mm

Knurled Finger Length:80mm

Baffle Plate Diameter:50mm

Baffle Plate Length:100mm

Baffle Thickness:20mm

Bending test (Test probe B) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances

 

 

This is the “International” test finger required by most IEC61032 test probe B, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements with integral palm simulator. The handle and stop face are made of nylon.  Finger is made of stainless steel. All parts precision machined.

 

  • HT-I02A: Conform to the IEC60335-1 clause 20.2. Means of a test probe that is similar to test probe B of IEC 61032 but having a circular stop face with a diameter of 50 mm, instead of the non-circular face.

 

  • HT-I02B: Conform to the IEC60335-2-14 clause 20.2. Means of a test probe that is similar to test probe B of IEC 61032 but having a circular stop face with a diameter of 125 mm instead of the non-circular face, the distance between the tip of the test finger and the stop face being 100 mm.

 

 

Using methods:

1,The joint portion of Standard test finger can not touch the live parts or hazardous parts ,and it can’t enter 20mm-50mm baffles

2,Prevent access to dangerous parts of the test requirements, Test B need to bring 30 ± 3N thrust. Usually use with force gauge

3,In the electric shock test, we need to wire and configure the power supply(mains), the lamp unit.

 

Note

Test probe is precision stainless steel products, please use of gently and pay attention to maintenance

Reference Standard

 

IEC61032 IEC60950 IEC60335

IEC60529 IEC60045 IEC60884

IEC60745

Specification

 

Knurled Finger Diameter:12mm

Knurled Finger Length:80mm

Baffle Plate Diameter:50mm

Baffle Plate Length:100mm

Baffle Thickness:20mm

test probe B 1.jpg

finger probe B.jpg

37 .jpg

750 ABCD probe 1_.jpg

Product picture

Reference Standard

Specification

 

 

IP1X Test Probe A

IEC60529   IEC61032 IEC60335

IEC61029   IEC60745 IEC60065

IEC60950

Ball Diameter:50mm

Baffle Plate Diameter:45mm

Baffle Plate Thickness:45mm

Handle Diameter:10mm

Handle Length:100mm

 

IP2X Test Probe B

IEC61032 IEC60950   IEC60335

IEC60529 IEC60045   IEC60884

IEC60745

Knurled Finger Diameter:12mm

Knurled Finger Length:80mm

Baffle Plate Diameter:50mm

Baffle Plate Length:100mm

Baffle Thickness:20mm

IP3X Test Probe C

IEC61032   IEC60529

Test Probe Length:100mm

Test probe Diameter:2.5mm

Dam-sphere Diameter:3.5mm

Handle Diameter:10mm

Handle Length:100mm

 

IP4X Test Probe D

IEC61032   IEC60529

Test Probe Length:100mm

Test probe Diameter:1.0mm

Dam-sphere Diameter:3.5mm

Handle Diameter:10mm

Handle Length:100mm

 

 

 


Product Image

Test Probe B IEC61032 IEC60529 IP2X with bendable joint  1
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shenzhen Bonad Precision Instrument Co,.ltd

room 301 HongDu building 45district Baoan,shenzhen china

Phone:
86-66608016
Fax:
86
Contact:
WENDY (SALES MANGER)
Mobile:
13418723413

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